INVESTIGATION OF ELECTRICAL PROPERTIES OF CIGS THIN FILMS DERIVED BY SOL-GEL PROCESS

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dc.authoridBaydogan, Nilgun/0000-0001-9843-1615
dc.authoridCimenoglu, Huseyin/0000-0002-9921-7108
dc.authoridCimenoglu, Huseyin/0000-0002-9921-7108
dc.authorwosidBaydogan, Nilgun/I-1298-2017
dc.authorwosidCimenoglu, Huseyin/ABB-4129-2020
dc.authorwosidCimenoglu, Huseyin/ABA-7628-2020
dc.contributor.authorBaydogan, N.
dc.contributor.authorCanci, U.
dc.contributor.authorAkyol, S.
dc.contributor.authorCimenoglu, H.
dc.date.accessioned2024-06-13T20:18:43Z
dc.date.available2024-06-13T20:18:43Z
dc.date.issued2014
dc.departmentİstanbul Gedik Üniversitesien_US
dc.description143rd TMS Annual Meeting & Exhibition -- FEB 16-20, 2014 -- San Diego, CAen_US
dc.description.abstractThe effects of deposition temperature on copper indium gallium diselenide Cu(In,Ga)Se-2 (CIGS) thin-film were examined to apply this layer in the CIGS solar cells. Electrical resistivity of CIGS layers was determined after CIGS thin films were deposited by sol-gel dip coating technique on substrates. The desired electrical resistivity is determined after annealing. The variations in electrical resistivity are investigated for the use in CIGS solar cells.en_US
dc.identifier.endpage381en_US
dc.identifier.isbn978-1-118-88985-5
dc.identifier.isbn978-1-118-88972-5
dc.identifier.startpage379en_US
dc.identifier.urihttps://hdl.handle.net/11501/1519
dc.identifier.wosWOS:000354941300047en_US
dc.identifier.wosqualityN/Aen_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.language.isoenen_US
dc.publisherJohn Wiley & Sons Incen_US
dc.relation.ispartofTms 2014 Supplemental Proceedingsen_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectCigs Thin Filmen_US
dc.subjectSolar Cellen_US
dc.subjectIrradiaitonen_US
dc.subjectElectrical Propertiesen_US
dc.subjectCellen_US
dc.titleINVESTIGATION OF ELECTRICAL PROPERTIES OF CIGS THIN FILMS DERIVED BY SOL-GEL PROCESSen_US
dc.typeConference Objecten_US

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